Molecular Vista
The Golden STM
Parameter survey
| Maximum Z-range: | 2 µm |
| Maximum X- and Y-Range | >> 600 nm |
| Noise in Z-direction | < 0.05 nm |
| Noise in X-direction | < 0.1 nm |
| Current noise | < 20 pA |
| Z-noise (approached) | < 200 pm |
| Lateral / vertical resolution: | atomic |
| Sample holder diameter | 12 mm |
STM body with implemented preamplifier
and electrochemical cell
HOPG
current image
topographic image
Imaging Modes
Special features
Image of a gold surface
Sputtered Gold Layer
on Silicon
Image Range: 200 nm
Height: 2.3 nm
Sputtered Gold Layer
on Silicon
Image Range: 200 nm
Height: 2.3 nm
Further experiments, e.g. for the detection of work function differences, can be added easily,
if an additional lockin amplifier is utilized.
The STM is provided complete with image acquisition and image processing software.
As accessory, we provide a tip etching tool for tungsten tips based on a scientific publication.
The tool is affordable, easy to handle and guaranties over 50 % usable STM tips.
if an additional lockin amplifier is utilized.
The STM is provided complete with image acquisition and image processing software.
As accessory, we provide a tip etching tool for tungsten tips based on a scientific publication.
The tool is affordable, easy to handle and guaranties over 50 % usable STM tips.
Mechanics & Accessories
The STM is provided with an 19” Anfatec-type SPM controller. It includes the 150 V amplification for 6 µm scan range.
STM tungsten tip etching Tool
The tip etching tool is provided with a detailed description and a
students practical training advice.
It is based on the droplet technique, which was first published in 1999. In combination with a power supply with current limitation one can reach STM tip diameters below 10 nm with over 50 % reproducibility.
19” controller
HV noise: |
<50 nV |
HV output: |
-150 V … 150 V |
D/A-noise: |
100 nV |
A/D noise: |
0.3 mV @ 40 kHz bandwidth |
power supply: |
~ 230 V, 500 mA |