Molecular Vista
AFM VistaScope - Applications
The VistaScope is a multi-purpose scanning nearfield microscope which combines high speed imaging with chemical identification. High Speed Raman Spectroscopy Mapping and TERS Configuration
With Raman Mapping it is possible to asSIXn chemical information to the topography image.
Scanning of a sample utelizing a highly focussed laser beam enables optical imaging with a resolution of 400 nm.
Photo-induced Force Microscopy (PiFM)
It detects near-field resonant optical scattering by measuring the dipole-dipole force interaction through the AFM cantilever.
scattering Scanning Near-field Optical Microscope (sSNOM)
Visualization of plasmonic resonances is possible via optically detected scattering SIXnal of a cantilever tip apex.
Visualization of plasmonic resonances is possible via optically detected scattering SIXnal of a cantilever tip apex.
High Speed AFM Imaging
The application of two z-piezos enables ultra-fast scans with superior image quality.
Conventional and Inverted Microscopy
A 20x objective (NA = 0.6) with a long working distance offers enough space for various and non-flat samples.
A 20x objective (NA = 0.6) with a long working distance offers enough space for various and non-flat samples. Additionally, an inverted 100x immersion objective with a numerical aperture of 1.45 ensures an enormous light collection efficiency.
Atomic Force Microscopy (AFM)
Conventional AFM enables depth profiling of atomic steps on Silicon with a height of only 0.26 nm..
Kelvin Probe Force Microscopy (KPFM)
The KPFM mode provides access to the work function of samples with a resolution close to conventional AFM performance.
Overview Applications Technical Details