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Vista One – The original PiF microscope for nano‑IR chemical analysis

Obtain nanoscale chemical maps and point spectra with much more detail than FTIR or nano‑FTIR, completely non-invasively!


Vista One microscope

Characterize at the highest resolution

  • Sub‑10 nm PiF‑IR spectroscopy and PiFM chemical image mapping in true non-contact mode
  • ~1 cm⁻¹ spectral resolution for nano‑IR experiments
  • Use existing FTIR spectra to identify materials

Designed for high‑throughput measurement

  • Tunable IR lasers can sweep a full PiF‑IR spectrum in 100 ms
  • Fixed‑wavelength PiFM images acquired in minutes
  • Optical alignments are maintained even when changing samples
  • hyPIR™ imaging and automated PCA tools for complete image + spectral datasets with minimal effort

Specifications

Stage and Scanner

  • Sample stage travel: 6 mm, max sample size: 25 × 25 × 5 mm
  • Scan size: 80 µm × 80 µm
  • Dual Z Feedback: 15 µm z-scanner with 1 µm fast-z scanner

Functionality

  • Imaging modes: Non-contact AFM, PiFM, KPFM, FvD (Force vs distance) mapping, Raman, s-SNOM
  • Spectroscopy modes: PiF-IR, FvD, Raman
  • QCL (770–1840, 1995–2395 cm−1), OPO/DFG (590–2050, 2250–4400, 5000–7000 cm−1)
  • Depth probed (IR): ~20 nm surface mode, >100 nm bulk mode

Physical Requirements

  • Table size: 1.6 m × 1.1 m
  • Optional acoustic enclosure (30W×30D×27H in3); with or without temperature control

Engineered for precision

  • Motorized stage with optical encoders for precision positioning
  • Capacitive sensors ensure fast and precise closed-loop piezo stage scan (~100 pm RMS precision)
  • Dual‑Z piezo scanner: image faster while avoiding artifacts

Proper optics integration – built to handle any light

  • 3D‑actuated parabolic mirror focuses excitation light on the side of the tip at any wavelength
  • Access the tip from top, bottom, or side via top objective, bottom optics (optional), and parabolic mirror
  • Configure up to six lasers for PiFM and PiF‑IR

Versatile and customizable

  • Supports sSNOM, confocal Raman, KPFM, cAFM, PFM, force‑volume mapping, and custom optics
  • Built with standard Thorlabs optical components for infinite configurability
  • Optional environmental/vacuum cover to work under controlled gas, temperature (±0.1 °C), humidity, or vacuum

Packages

Vista One IR

Microscope
Vista One frame
Isolation
Active vibration isolation table; acoustic enclosure with temperature control
Lasers
Choice of QCL, OPO/DFG
Multiplexer
Medium
Inverted Optics
Optional

Add‑ons
  • Environment/humidity/ vacuum control
  • Heated stage
  • Polarization switcher
  • Dry‑air filtration
  • KPFM, cAFM, PFM, force‑volume mapping
  • Spectrometer
  • Photon counter (SP‑APD)
  • s‑SNOM module

Vista One IR + s‑SNOM

Everything in Vista One IR, plus:

  • Large multiplexer
  • Required add‑on: s‑SNOM module

Vista One IR + PL/Raman

Everything in Vista One IR, plus:

  • Visible diode laser
  • Large multiplexer
  • Required add‑on: spectrometer

Vista One DIY

Microscope
Vista One frame
Isolation
Active vibration isolation; acoustic enclosure with temperature control
Lasers
Bring your own
Multiplexer
Optional
Add‑ons
Optional

Applications

  • Semiconductors & nanofabrication failure analysis
  • Polymers, composites, and biomaterials
  • 2D materials and thin films
  • Surface chemistry (e.g., SAM coverage) and contamination
  • Inorganics and oxides; ALD films; hydrophilic surface terminations

From our customers

“We were fortunate to acquire one of the first VistaScopes from Molecular Vista... The system is stable, easily configurable with additional optics, and is controlled by an intuitive and versatile graphical user interface.”
— Eric Potma, PhD., Associate Professor, Department of Chemistry, University of California, Irvine
PiFM images show PS-b-PMMA block co-polymer infiltrated with aluminum oxide. The lamellae show a full pitch of 41 nm where PS is only ~9nm wide.

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Anne D. Mueller