Molecular Vista
Vista 75 – The next generation of PiFM and PiF-IR instruments
Smaller footprint, accessible design, robust laser integration, and a self-contained system with built-in vibration isolation and a temperature-controlled acoustic enclosure.
Overview
Smaller footprint
Vista 75 has been made more compact with a completely new acoustic enclosure—over 60% less space than Vista One.
Accessible design
Easy sample access and a one-handed AFM head clamp streamline tip and sample exchanges. Lightweight removable enclosure and open design simplify optical alignments.
Larger samples
75 mm of stage travel—if it fits on the stage, Vista 75 can provide results.
Specifications
Stage and Scanner
- Sample stage travel: 75 mm, max sample 140 mm square
- Scan size: 80 µm × 80 µm. (100 µm × 100 µm optional)
- Dual Z Feedback: 12 µm z-scanner with 600 nm fast-z scanner
Functionality
- Imaging modes: Non-contact AFM, PiFM, KPFM, FvD (Force vs distance) mapping, Raman, s-SNOM
- Spectroscopy modes: PiF-IR, FvD, Raman
- Laser Options: QCL (770–1840, 1995–2395 cm−1), OPO/DFG (590–2050, 2250–4400, 5000–7000 cm−1)
- Depth probed (IR): ~20 nm surface mode, >100 nm bulk mode
Physical Requirements
- System dimensions: Requires a 1.2 m × 2.4 m (4 ft × 8 ft) optical breadboard
- Enclosure: Less than 13 kg, removable, acoustic insulation, temperature controlled with dry air
Quick-change optics
Pre-aligned optics make switching between PiFM + PiF-IR, s-SNOM, and Raman effortless.
Robust laser integration
A 3D-actuated PM mirror keeps excitation lasers aligned to the AFM tip apex for PiFM, PiF-IR, s-SNOM, and tip-enhanced Raman.
Self-contained system
Built-in vibration isolation and a temperature-controlled acoustic enclosure with dry air—no special environment required.
Sub-5 nm IR spatial resolution
PiFM chemical mapping provides unbeatable lateral IR resolution for analyzing surface chemistry with single-molecule level sensitivity
Software & Control
VistaScan™ provides an intuitive, unified interface for PiFM, PiF-IR, and related nanospectroscopy modes. Automated laser alignment, spectral acquisition, and image processing are fully integrated and includes a scripting API for custom measurement recipes.
Packages
Vista 75 IR
- Microscope: Vista 75 frame
- Isolation: active vibration isolation table and temperature-controlled acoustic enclosure
- Laser(s): QCL or OPO/DFG
- Multiplexer: medium (≤3 laser inputs + polarization) or large (≤6 inputs + polarization)
- Add-ons (optional): polarization switcher, dry-air filtration, KPFM, cAFM, PFM, tip-enhanced Raman/PL, s-SNOM module
Vista 75 IR + s-SNOM
- Everything in Vista 75 IR
- Configured to operate concurrently with PiFM (best-in-class detection)
- Multiplexer: large
- Required add-ons: s-SNOM module (Michelson interferometer for near-field amplitude & phase)
Vista 75 IR + PL/Raman
- Everything in Vista 75 IR
- Tip-enhanced Raman/PL via integrated Parabolic Mirror; concurrent with PiFM
- Laser(s): visible diode laser (also PiFM-capable)
- Multiplexer: large
- Required add-ons: tip-enhanced Raman/PL module
Applications
- Inorganic: Combining STEM and PiFM for complementary nanoscale sample analysis
- Polymer & Semiconductor: Characterization of self-assembled monolayer (SAM) coverage
- Biological: Surface-sensitive characterization of ALD films on drug particles
- Semiconductor: Measurement of –OH termination on hydrophilic surfaces
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