||HI'RES-C is a SPM probe that has extremely sharp
high aspect ratio extratip at the apex.
Typical curvature radius of extratip ......... 1 nmThe outstanding feature of the extratip is a subnanometer curvature radius. With the new HI'RES-C probe, it becomes possible to achieve surprisingly high resolution of nanometer-sized objects like single molecules, ultrathin films, porous materials, etc.
HI'RES-C probe is more hydrophobic and suffers less contamination than silicon one. The probe is sufficiently wear-resistant for obtaining many routine scans without loss of resolution.
In general, there are additional smaller extratips near the main one. Though the extratips are of different height and angle, double imaging is possible on rough surfaces.
Recommended RMS roughness of the surface ...... < 20nm
Information / Types of HI'RES-C
|DP14/HI'RES-C/Al BS||Rectangular cantilever (160 kHz, 5 N/m). HI'RES-C probe. Backside Al-coated.||495 €|
|DP15/HI'RES-C/Al BS||Rectangular cantilever (325 kHz, 40 N/m). HI'RES-C probe. Backside Al-coated.||495 €|
|DP16/HI'RES-C/Al BS||Rectangular cantilever (170 kHz, 40 N/m). HI'RES-C probe. Backside Al-coated.||495 €|
cantilever (12 kHz,
0.15 N/m). HI'RES-C probe. Backside Al-coated. for contact mode
|DP18/HI'RES-C/Al BS||Rectangular cantilever (75 kHz, 3.5 N/m). HI'RES-C probe. Backside Al-coated.||495 €|
|DP19/HI'RES-C/Al BS||Rectangular cantilever (80 kHz, 0.63 N/m). HI'RES-C probe. Backside Al-coated.||495 €|