Anfatec Instruments AG
Measurement Science and Technology &
Scanning Probe Microscopy

VistaScope
Multi Purpose Scanning Microscope


Designed by
Molecular Vista, Inc.
(CEO: Sung Park, Ph.D., Co-Founder of Park Scientific Instruments)
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High Speed Raman Spectroscopy Mapping and TERS Configuration

With Raman Mapping it is possible to assign chemical information to the topography image.

Acquired with the Spec64.


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Confocal Scanning Imaging

Scanning of a sample utelizing a highly focussed laser beam enables optical imaging with a resolution of 400 nm.


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Photo-induced Force Microscopy (PiFM)

Photo-induced Force Microscope (PiFM) detects near-field resonant optical scattering by measuring the dipole-dipole force interaction through the AFM cantilever.


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scattering Scanning Near-field Optical Microscope (sSNOM)

Visualization of plasmonic resonances is possible via optically detected scattering signal of a cantilever tip apex.


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Atomic Force Microscopy (AFM)

Conventional AFM enables depth profiling of atomic steps on Silicon with a height of only 0.26 nm.


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Kelvin Probe Force Microscopy (KPFM)

The KPFM mode provides access to the work function of samples with a resolution close to conventional AFM performance.


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High Speed AFM Imaging

The application of two z-piezos enables ultra-fast scans with superior image quality.


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Conventional and Inverted Microscopy

A 20x objective (NA = 0.6) with a long working distance offers enough space for various and non-flat samples. Additionally, an inverted 100x immersion objective with a numerical aperture of 1.45 ensures an enormous light collection efficiency.


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