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HI'RES-W

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HI'RES probe is a revolutionary product that significantly enhances the resolution of SPM. It's made of tungsten that provides high resistance to wear and contamination when scanning. Due to its unsurpassed 1 nm curvature radius, it's capable of imaging surface features previously hidden under tip artifacts.
 
HiRes-W probe
 HI'RES-W is a brand-new SPM probe that has extremely sharp tip made of tungsten at the apex.
Typical curvature radius of extratip ....1 nm
Typical height of extratip ....................... 100 .. 200 nm
Recommended RMS roughness of the surface ...... < 150 nm
The outstanding feature of the extratip is a subnanometer curvature radius. With the new HI'RES-W probe, it becomes possible to achieve surprisingly high resolution of nanometer-sized objects like single molecules, ultrathin films, porous materials, etc. The advantage vs. the HI'RES-C probe is, that it contains only a single tip.

HI'RES-W probe is more hydrophobic and suffer less contamination than silicon one. The new probe is sufficiently wear-resistant for obtaining many routine scans without loss of resolution.

Ordering Information / Types of HI'RES-W Cantilevers:
   

Order No.
 Description Price/5 Pcs. Price/15 Pcs.
DP14/HI'RES-W/Al BS Rectangular cantilever (160 kHz, 5 N/m). HI'RES-C probe. Backside Al-coated. 400 € 900 €
DP15/HI'RES-W/Al BS  Rectangular cantilever (325 kHz, 40 N/m). HI'RES-C probe. Backside Al-coated.  400 € 900 €
DP16/HI'RES-W/Al BS Rectangular cantilever (170 kHz, 40 N/m). HI'RES-C probe. Backside Al-coated. 400 € 900 €