Anfatec Instruments AG

Measurement Science and Technology &
Scanning Probe Microscopy

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HI'RES-W

HI'RES probe is a revolutionary product that significantly enhances the resolution of SPM. It's made of non-oxidizing hydrophobic form of carbon that provides high resistance to wear and contamination when scanning. Due to its unsurpassed 1 nm curvature radius, it's capable of imaging surface features previously hidden under tip artifacts.
 
HiRes-W probe
 HI'RES-W is a brand-new SPM probe that has extremely sharp tip made of tungsten at the apex.
Typical curvature radius of th extra-tip ....1 nm
Typical height of extratip ....................... 100 .. 200 nm
Recommended RMS roughness of the surface ...... < 150 nm
The outstanding feature of the extratip is a subnanometer curvature radius. With the new HI'RES-W probe, it becomes possible to achieve surprisingly high resolution of nanometer-sized objects like single molecules, ultrathin films, porous materials, etc. The advantage vs. the HiRes probes is, that it contains only a single tip.

HI'RES-W probe is more hydrophobic and suffer less contamination than silicon one. The new probe is sufficiently wear-resistant for obtaining many routine scans without loss of resolution.

Ordering Information / Types of HI'Res-W Cantilevers:
   

Order No.
 Description Price/5 Pcs. Price/15 Pcs.
DP14/HI'RES-W/Al BS Rectangular cantilever (160 kHz, 5 N/m). HI'RES-C probe. Backside Al-coated. 400 € 900 €
DP15/HI'RES-W/Al BS  Rectangular cantilever (325 kHz, 40 N/m). HI'RES-C probe. Backside Al-coated.  400 € 900 €
DP16/HI'RES-W/Al BS Rectangular cantilever (170 kHz, 40 N/m). HI'RES-C probe. Backside Al-coated. 400 € 900 €