Anfatec Instruments AG
Measurement Science and Technology &
Scanning Probe Microscopy

Scanning Kelvin Probe System (AFT-KP150)

This Scanning Kelvin Probe System moves the KP-Head in vertical direction in order to realize an motorized approach between the KP Probe and the Sample. The Samples are mounted on a Vacuum Chuck that moves the Sample 150 mm by 150 mm across the Base Frame.
Like in the Single Point KP System, the KP Head can be easily exchanged.

Parameters and Special Features:
  • Motorized Approach between Tip and Sample
  • Motorized X-Y-Movement over 150 mm x 150 mm
  • Active Position Tracking with Encoders
  • Step Size in Z-direction: 625 nm
  • Full Step in X - and Y-direction: 5 µm / microstep operation used
  • Work Function Resolution: < 1 meV with 1.4 mm tip diameter on metals
  • Smallest available Tip Diameter: 0.1 mm
  • Integrated Faraday Shield
  • Gold plated Steel Frame
  • Two Golden KP-Heads included
  • Maximum Dimensions: 50 cm (W) x 60 cm (D) x 25 cm (H)
  • Maximum Sample Size: 150 mm x 150 mm
  • Vacuum Sample Chuck
  • Included Reference Samples: HOPG, Au on Si, Al/Au-edge, Potential Check
  • Humidity and Temperature Sensor (USB)
  • Optional: Protective Housing
  • Optional: Rainbow Source (USB)

Example Images The system is delivered with the Thomson II controller and a Windows PC. A Scripting Language allows the user to define Measurement Procedures and provides maximum flexibility.
This system can be scaled to up to 70 cm x 50 cm Sample Size. It can be equiped with an independently moving Top Contact whose function is checked with a capacitive circuit. Thus, surface layers on large scale glass substrates with electrode intersections can be analysed.