Anfatec Instruments AG
Measurement Science and Technology &
Scanning Probe Microscopy

Anfatec Present

Image Analysis Software



  • includes all basic functions for Scanning Probe Applications
  • loads Anfatec image sets by calling the main 
  • file imports Omicron, TopoMetrix and Burleigh data
  • shows the image information (mode, day/time, drive,...)
  • leveling functions
    • line-wise, row-wise
    • selected area 1st order and 2nd order
    • zero correction (0th order)
    • point-selection based
  • filter functions
    • low- and high-pass
    • mean and noise
    • Fourier transformation
  • histogram based brightness and contrast adjustment
  • adaptable color palette / user specific
  • color palettes
  • line analysis with measuring function, averaging over lines
  • roughness analysis
  • 3D view
  • unit cell based non-linearity determination and correction
  • tip diameter estimation 
  • mathematical operations between images
  • removal of lateral nonlinearities by distorsion correction
  • data output
    • save as single Anfatec image 
    • save as BMP
    • Copy to Clipboard
    • Save as WMF or BMP from any menu

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Present Manual (955 kB, PDF)
Anfatec Present as Freeware

Menues available in Present









Screenshots



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