- Vibration isolation table under the microscope
- Hardware scanner linearisation (feed forward type)
- Glass bell jar for acoustic protection
- Additional cantilever packages and gratings
- Enhanced LFM mode sensitivity (circular laser diode)
- Additional LockIn amplifier for dynamic EFM or MFM
- Implemented Kelvin feedback
- Current amplifier for conductance AFM incl. power supply
- SPIP - Scanning Probe Image Processor - with all customer specific
modules from Imaging Metrology
- 2nd TFT monitor in 19“
|
|
