Anfatec Instruments AG
Measurement Science and Technology &
Scanning Probe Microscopy

Level AFM - the affordable solution for the basic needs

New Top View Camera available now!

List prices starting from 19.990 Euro

Data Sheet
Optional Features

Our Level AFM offers a wide Spectrum of Measurement Methods:

System News:

  • hardware-linearisation 
  • improved HV-noise for higher resloution in combination with large scan range
  • new scan modes (e.g. SGM)

Image Gallery
AFM-Head including a Top View Camera and Sample Illumination
controller for the fast Approach of Tip and Sample