Our Level AFM offers a wide Spectrum of Measurement Methods:

• High Resolution Dynamic & Contact Mode
  
• Current-AFM Mode
  
• Lateral Force Mode
• Force Spectroscopy
  
• Kelvin Probe Force Microscopy
  
• Magnetic Force Microscopy (2^nd trace imaging)
  
• Electrical Force Microscopy
  
• Nano-Lithography with script-language
  
• Elastic Force Microscopy (Force Modulation Mode)
  

System News:

• hardware-linearisation 
  
• improved HV-noise for higher resloution in combination with large scan range
• new scan modes (e.g. SGM)