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Optional features (not necessary for standard applications):

•  Vibration isolation table under the microscope


•  separate tip contact for EFM


•  scanner linearisation


•  glass bell jar for acoustic protection


•  additional cantilever packages and gratings


•  enhanced LFM mode sensitivity (spot like laser diode)


•  external lockin amplifier


•  SPIP – Danish software for image evaluation


•  2^nd TFT monitor