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The system consists of:

• a base plate made from stone with wiring,
• vibration isolation
• microscope base:
• 3 integrated miniaturized stepper motors for head levelling
• lateral coarse positioning with 6 mm travel range
• self-adjustable grooves (head is always in same position)
• calibrated scanner (about 30 µm range)
• electrical contact to sample (can be used for Electrical Force Microscopy)
• standard AFM-head
• laser diode maximum 3 mW, 670 nm with lens system
• laser adjustment in three axis
• integrated 4-quadrant photo-detector with amplifier electronics
• adjustment of the laser beam onto the photo detector in two directions (X, Y)
• built-in dither piezo for acoustical excitation in dynamic mode
• integrated illumination
• color-camera with microscope optic with a direct view onto the cantilever
• uncomplicated mounting of the cantilever chips
• high voltage amplifier V45C
• DS4L-Modul with Interface to the AMU 2.4
• control of the level station
• 8 x 24-bit D/A and 8 x 24-bit A/D channels
• Anfatec Measurement Interface AMU 2.4 (PCI bus board with integrated LockIn amplifier)
• tools: 1 calibration grating UMG01, 1 start-up set of cantilevers (15 pcs.), connection cables
• English or German manual, certain tutorials for NC AFM, contact AFM, Scanner calibration
• control computer:
• 64-bit AMD processor
• 17“ TFT monitor
• video card
• installed software: Windows XP, Anfatec Scan with GNU GPL, Anfatec Present
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