a base plate made from stone with wiring,

vibration isolation

microscope base:

• 3 integrated miniaturized stepper motors for head levelling
• lateral coarse positioning with 6 mm travel range

• self-adjustable grooves (head is always in same position)

• calibrated scanner (about 30 µm range)
  

• electrical contact to sample (can be used for Electrical Force Microscopy)

standard AFM-head

• laser diode maximum 3 mW, 670 nm with lens system

• laser adjustment in three axis

• integrated 4-quadrant photo-detector with amplifier electronics

• adjustment of the laser beam onto the photo detector in two directions (X, Y)

• built-in dither piezo for acoustical excitation in dynamic mode

• integrated illumination

• color-camera with microscope optic with a direct view onto the cantilever
  

• uncomplicated mounting of the cantilever chips

high voltage amplifier V45C

• DS4L-Modul with Interface to the AMU 2.x

• control of the level station



• 8 x 24-bit D/A and 8 x 24-bit A/D channels
  

Anfatec Measurement Interface AMU 2.x (PCI bus board with integrated LockIn amplifier)

tools: 1 calibration grating UMG01, 1 start-up set of cantilevers (15 pcs.), connection cables

English or German manual, certain tutorials for NC AFM, contact AFM, Scanner calibration

control computer:

• 64-bit AMD processor

• 17“ TFT monitor

• video card

• installed software: Windows XP, Anfatec Scan with GNU GPL, Anfatec Present