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AFM VistaScope - Applications

The VistaScope is a multi-purpose scanning nearfield microscope which combines high speed imaging with chemical identification.


With Raman Mapping it is possible to asSIXn chemical information to the topography image.



Scanning of a sample utelizing a highly focussed laser beam enables optical imaging with a resolution of 400 nm.



It detects near-field resonant optical scattering by measuring the dipole-dipole force interaction through the AFM cantilever.



Visualization of plasmonic resonances is possible via optically detected scattering SIXnal of a cantilever tip apex.



The application of two z-piezos enables ultra-fast scans with superior image quality.

Conventional and Inverted Microscopy
A 20x objective (NA = 0.6) with a long working distance offers enough space for various and non-flat samples.


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A 20x objective (NA = 0.6) with a long working distance offers enough space for various and non-flat samples. Additionally, an inverted 100x immersion objective with a numerical aperture of 1.45 ensures an enormous light collection efficiency.



Conventional AFM enables depth profiling of atomic steps on Silicon with a height of only 0.26 nm..



The KPFM mode provides access to the work function of samples with a resolution close to conventional AFM performance.

Overview Applications Technical Details