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Atomic Force Microscopy (AFM)

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Atomic Steps on Silicon

The ultra-stable rigid housing provides low noise measurements. On the left, an topography image of atomic steps of a silicon surface with a low offcut angle is shown. The height of the displayed steps is 0.26 nm.

The image was taken in dynamic non-contact mode.

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DNA Strands on Mica

The topography image of immobilized DNA strands on a flat mica surface is an example for the high resolution accessible with the VistaScope instrument.

The image was taken in dynamic non-contact mode.

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