ARTTM probes are single crystal diamond (SCD) tips specially grown in
CVD process and attached to silicon cantilevers for use in AFM. ARTTM
growth technology provides durable and chemically inert probes with
high aspect ratio and small tip radius by affordable price comparable
to that of traditional silicon probes. SCD tip usually has a sharp
edge at the apex which makes it applicable for imaging flat surfaces w
ith high resolution.
The diamond tips of the ARTTM SCD probes
are glued onto cantilevers and have extraordinary properties.
Typical curvature radius of extratip ......... 5-10 nm
Typical aspect ratio ....................... 1 : 5