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Publications
Publications with the Anfatec USBLockIn250K. Adhitya, A. Alsulami, A. Buckley, R. C. Tozer, and Martin Grell: Intensity-Modulated Spectroscopy on Loaded Organic Photovoltaic Cells IEEE JOURNAL OF PHOTOVOLTAICS, VOL. 5, NO. 5, SEPTEMBER 2015, p. 1414-1421. DOI: 10.1109/JPHOTOV.2015.2447838 |
Selected Publications with the Anfatec AFMT. Slobodskyy, A. V. Zozulya, R. Tholapi, L. Liefeith, M. Fester, M. Sprung, and W. Hansen: Versatile atomic force microscopy setup combined with micro-focused X-ray beam Review of Scientific Instruments 86, 065104 (2015) DOI: 10.1063/1.4922605 C. Belgardt, T. Blaudeck, C. von Borczyskowski, H. Graaf Self-Assembly of Ordered Colloidal Nanoparticle Films in Few-Micron Wide Laser-Desorbed Lines of Octadecylsiloxane Monolayers on Silicon Oxide Surfaces Adv. Eng. Mater. 16 (9), 1090-1097 (2014). Chr. Belgardt , E. Sowade , Th. Blaudeck , Th. Baumgärtel , H. Graaf , Chr. von Borczyskowski and R. R. Baumann: Inkjet printing as a tool for the patterned deposition of octadecylsiloxane monolayers on silicon oxide surfaces Phys. Chem. Chem. Phys. 15 (20), 7494-7504 (2013) DOI: 10.1039/C3CP50331C T. Baumgärtel, C. v. Borczyskowski and H. Graaf: Detection and stability of nanoscale space charges in local oxidation nanolithography IOP PUBLISHING Nanotechnology 23, 095707 (2012) DOI: 10.1088/0957-4484/23/9/095707 C. Baumgart, A.-D. Müller, F. Müller, H. Schmidt: Kelvin probe force microscopy in the presence of intrinsic local electric fields phys. stat. sol. (a), 208, 777-789 (2011) (Editor’s choice and Back cover) DOI: 10.1002/pssa.201190013 Daniel Russo, Randy D. Fagan, and Thorsten Hesjedal: An Undergraduate Nanotechnology Engineering Laboratory Course on Atomic Force Microscopy IEEE Tansactions On Education 54 (3), 0018-9359 (2010) DOI: 10.1109/TE.2010.2066566 C. Baumgart, M. Helm, and H. Schmidt: Quantitative dopant profiling in semiconductors: A Kelvin probe force microscopy model Phys. Rev. B 80, 085305 (2009) DOI: 10.1103/PhysRevB.80.085305 R. Scholz, D. Lehmann, A.-D. Müller, F. Müller and D. R. T. Zahn: Potentiometry on pentacene OFETs: Charge carrier mobilities and injection barriers in bottom and top contact configurations phys. stat. sol. (a), 1–9 (2008) DOI: 10.1002/9783527627387.ch20 R. Scholz, A.-D. Müller, F. Müller, I. Thurzo, B.A. Paez, L. Mancera, D.R.T. Zahn, C. Pannemann, U. Hilleringmann: Comparison between the charge carrier mobilities in pentacene OFET structures as obtained from electrical characterization and potentiometry Proceedings of SPIE 5940, 594000I-1 (2005) TU-Chemnitz.de |
Selected Publications of Anne and FalkA.-D. Müller, F. Müller: Frequency dependent Kelvin Probe Force Microscopy on Silicon J. Vac. Sci. Technol. B 27 (2), 969 (2009) DOI: 10.1116/1.3039682 B. Graffel, F. Müller, A.-D. Müller, M. Hietschold: Feedforward correction of nonlinearities in piezoelectric scanner constructions and its experimental verification Rev. Sci. Instr. 78, 053706 (2007) DOI: 10.1063/1.2736786 Anne-D. and Falk Müller: Xilinx PROM Programmer - Parallel port serial PROM burner Elektor 10/2003, S. 68 (pushlished in 4 languages) Elektor.com A.-D. Müller, F. Müller, J. Middeke, J. Mehner, J. Wibbeler, Th. Gessner, M. Hietschold: Double-cantilever device for Atomic Force Microscopy in dynamic noncontact-mode Microelectron. Reliab. 42 (9-11), 1685 (2001) DOI: 10.1016/S0026-2714(02)00212-3 F. Müller, A.-D. Müller, G. Schmid: Electronic properties of selfassembled monolayers on Au(111) studied by Electrical Force Spectroscopy Phys. Rev. B 63 (20), 205403 (2001) DOI: 10.1103/PhysRevB.63.205403 A.-D. Müller, F. Müller, M. Kröll, G. Schmid: Highly resolved electrical force microscopy study on metal filled anodic alumina Appl. Surf. Sci. 171, 125-129 (2001) DOI: 10.1016/S0169-4332(00)00554-7 A.-D. Müller, F. Müller, M Hietschold, F. Demming, J. Jersch, K. Dickmann: Characterization of electrochemically etched tungsten tips for Scanning Tunneling Microscopy Rev. Sci. Instr. 70 (10), 3970-72 (1999) DOI: 10.1063/1.1150022 A.-D. Müller, F. Müller, M. Hietschold: Detecting work function differences in Scanning Tunneling Microscopy Appl. Phys. Lett. 74 (20), 2963-65 (1999) DOI: 10.1063/1.123980 F. Müller, A.-D. Müller, M. Hietschold, S. Kämmer: Detecting electrical forces in noncontact Atomic Force Microscopy Meas. Sci. Technol. 9, 734 (1998) DOI: 10.1088/0957-0233/9/5/002 F. Müller, A.-D. Müller, O. Meissner, A. Heilmann, M. Hietschold: Enhanced local surface conductivity measurements by STM Rev. Sci. Instr. 68 (8), 3104-3106 (1997) DOI: 10.1063/1.1148250 |